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XRF is an X-ray spectrometric technique for elemental analysis of a wide variety of materials. Other phrases for XRF instruments include: Typical uses of EDXRF include the analysis of petroleum oils and fuel, plastic, rubber and textiles, pharmaceutical products, foodstuffs, cosmetics and body care products, fertilizers, geological materialsmining feeds, slags and tails, cementheat-resistant materials, glass, ceramics, catalystswafers; the determination of coatings on paperfilm, polyester; metals and alloysglass and plastic; forensics; multi-layer thin films on silicon wafers, photovoltaics and rotating storage media as well as pollution monitoring of solid waste, effluent, cleaning fluids, pools and filters.

In addition, X-ray Transmission XRT process gauges are employed to measure sulfur S in crude oil and marine bunker fuel. XRF and EDXRF spectrometers are the elemental analysis tool of choice, for many applications, in that they are smaller, simpler in design and cost less to operate than other technologies like inductively coupled plasma optical emission spectroscopy ICP-OES and atomic absorption AA or atomic fluorescence AF spectroscopy.

Examples of some common EDXRF applications are: Cement and raw meal: Other examples of common EDXRF applications include: Gasoline, diesel and RFG: RCRA metals, chlorides, phosphates, etc.

Additionally, EDXRF and XRF are employed to quantify atomic elements in: Food, pet food and other animal feed: CCA, Penta, ACQ, ACZA, phosphorus-based fire retardants, copper naphthanate, zinc napthanate, TBTO, IPBC and combinations of these; Antacids: The technique is generally non-destructive, requiring little if any sample preparation, and is suitable for almost all sample types.

In addition to elemental analysis, EDXRF spectrometers may be used to measure the thickness and composition of multi-layer thin films. In X-ray fluorescence XRFan electron can be ejected from its atomic orbital by the absorption of a light wave photon of sufficient energy.

When an inner orbital electron is ejected from an atom middle imagean electron from a higher energy level orbital will be transferred to the lower energy level orbital.

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During this transition a photon maybe emitted from the atom bottom image. This fluorescent light is called the characteristic X-ray of the element. The energy of the emitted photon will be equal to the difference in energies between the two orbitals occupied by the electron making the transition. Because the energy difference between two specific orbital shells, in a given element, is always the same i. Therefore, by determining the energy wavelength of the X-ray light photon emitted by a particular element, it is possible to determine the identity of that element.

For a particular energy wavelength of fluorescent light emitted by an element, the number of photons per unit time generally referred to as peak intensity or count rate is related to the amount of that analyte in the sample. In EDXRF spectroscopy, the counting rates for all detectable elements within a sample are usually calculated by counting, for a set amount of time, the number of photons that are detected for the various analytes' characteristic X-ray energy lines.

It is important to note that these fluorescent lines are actually observed as peaks with a semi-Gaussian distribution because of the imperfect resolution of modern detector technology.

Therefore, by determining the energy of the X-ray peaks in a sample's legit websites to make money taking surveys, and by calculating the count rate of the various elemental peaks, it is possible to qualitatively establish the elemental composition of the samples and to quantitatively measure the concentration of these elements.

Standardless Elemental Analysis with EDXRF. X-ray transmission gauging involves measuring the attenuation of a monochromatic X-ray beam savage 10fp custom parts a specific energy 21 keV that is specific to sulfur S.

In hsbc bank hk share price, a process stream passes through a flowcell where sulfur Sin the hydrocarbon matrix, absorbs X-rays transmitted between an X-ray source and detector see schematic at left.

The recorded X-ray intensity is inversely proportional to the sulfur concentration, thus the highest sulfur levels transmit the least X-rays. As illustrated in the table, 21 keV is chosen as the energy of X-rays employed in the measurement because: Thus the method is insensitive to changes in the C: H ratio and is primarily sensitive to only the sulfur content.

Established in as the " E nergy D ispersive Forexoma chart analyzer robot - R ay F luorescence "Center of Excellence" division of Rigaku Corporation, Applied Rigaku Technologies, Inc.

Austin, Texas, USA is responsible for the engineering and production of Rigaku EDXRF products worldwide.

At the PittCon exhibition in March in Philadelphia, ART accelerates our pace on innovation with the introduction to the world of our fifth new product: The company designs and manufacturers benchtop EDXRF elemental analysis instrumentation for non-destructive analytical chemistry applications, including atomic spectroscopy spectrometryquantitative and qualitative elemental analysis.

In addition, ART offers a third generation X-ray Transmission X-ray Absorption process gauge NEX XT for the determination of sulfur sulphur in a wide variety of heavy viscous hydrocarbon matrices, including bunker fuels, crude oil, and residuums.

Since its inception inRigaku has been at the forefront of analytical and industrial instrumentation technology. Today, with hundreds of major innovations to their credit, the Rigaku Group of Companies are world leaders in the fields of general X-ray diffraction XRDthin film analysis XRF, XRD and XRRX-ray fluorescence spectrometry TXRF, EDXRF and WDXRFsmall angle X-ray scattering SAXSprotein and small molecule X-ray crystallography, Raman spectroscopy, X-ray optics, semiconductor metrology TXRF, XRF, XRD and XRRlaboratory automation, X-ray sources, computed tomography, nondestructive testing and thermal analysis.

Rigaku employs over 1, people worldwide in operations based in Japan, the U. We value our people. Our value comes from them.

Close collaboration between our users and employees sets the direction and focus of our work, allowing us to address customers' needs and stay close to the market place. EDXRF Applications XRF Theory Standardless XRF Sulfur Process Gauge About Rigaku EDXRF Applications by Industry Sector - click for more detailed information Catalysts. Standardless Elemental Analysis with EDXRF Rigaku X-ray spectrometers may be used in conjunction with Fundamental Parameters FP software to allow for elemental quantification of completely unknown samples without standards.

For example, the Rigaku NEX CG energy dispersive X-ray fluorescence analyzer is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting RPF technology.

RPF-SQX greatly reduces the number of required standards, for a given level of calibration fit, as compared to conventional EDXRF spectrometric analytical software. As elemental analysis standards are expensive, and can be difficult to obtain for many applications, the utility of RPF-SQX can significantly lower the cost of ownership and reduce workload requirements for routine energy dispersive X-ray fluorescence based elemental analysis.

Rigaku NEX XT for On-line Sulfur.

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X-ray Transmission XRT gauging has long been an accepted technique for the measurement of sulfur S in heavy hydrocarbon process streams. XRT Method X-ray transmission gauging involves measuring the attenuation of a monochromatic X-ray beam at a specific energy 21 keV that is specific to sulfur S.

Element Molar Absorptivity 21 keV H 0. Applied Rigaku Technologies, Inc. Ask for more information about our Rigaku EDXRF elemental analysis products: